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  october 2011 ?2011 fairchild semiconductor corporation FDMB2307NZ rev.c5 www.fairchildsemi.com 1 FDMB2307NZ dual common dr ain n-channel powertrench ? mosfet FDMB2307NZ dual common drain n-channel powertrench ? mosfet 20 v, 9.7 a, 16.5 m features ? max r s1s2(on) = 16.5 m at v gs = 4.5 v, i d = 8 a ? max r s1s2(on) = 18 m at v gs = 4.2 v, i d = 7.4 a ? max r s1s2(on) = 21 m at v gs = 3.1 v, i d = 7 a ? max r s1s2(on) = 24 m at v gs = 2.5 v, i d = 6.7 a ? low profile - 0.8 mm maximum - in the new package micro fet 2x3 mm ? hbm esd protection level > 2 kv (note 3) ? rohs compliant general description this device is designe d specifically as a single package solution for li-ion battery pack protection circuit and other ultra-portable applications. it features tw o common drain n-channel mosfets, which enables bidi rectional current flow, on fairchild?s advanced powertrench ? process with state of the art microfet leadframe, the FDMB2307NZ minimizes both pcb space and r s1s2(on) . application ? li-ion battery pack mlp 2x3 s1 s2 g1 g2 s2 s1 6 5 4 3 2 1 g1 s1s1 g2 s2s2 d1/d2 pin 1 pin 1 bottom top mosfet maximum ratings t a = 25c unless otherwise noted thermal characteristics package marking and ordering information symbol parameter ratings units v s1s2 source1 to source2 voltage 20 v v gs gate to source voltage (note 4) 12 v i s1s2 source1 to source2 current -continuous t a = 25c (note 1a) 9.7 a -pulsed 40 p d power dissipation t a = 25 c (note 1a) 2.2 w power dissipation t a = 25 c (note 1b) 0.8 t j , t stg operating and storage junction temperature range -55 to +150 c r ja thermal resistance, junction to ambient(dual operation) (note 1a) 57 c/w r ja thermal resistance, junction to ambient(dual operation) (note 1b) 161 device marking device package reel size tape width quantity 307 FDMB2307NZ mlp 2x3 7?? 8 mm 3000 units
FDMB2307NZ dual common dr ain n-channel powertrench ? mosfet www.fairchildsemi.com 2 ?2011 fairchild semiconductor corporation FDMB2307NZ rev.c5 electrical characteristics t j = 25c unless otherwise noted off characteristics on characteristics dynamic characteristics switching characteristics source1- source2 diode characteristics symbol parameter test conditions min typ max units i s1s2 zero gate voltage source1 to source2 current v s1s2 = 16 v, v gs = 0 v 1 p a i gss gate to source leakage current v gs = 12 v, v s1s2 = 0 v 10 p a v gs(th) gate to source threshold voltage v gs = v s1s2 , i s1s2 = 250 p a0.611.5v r s1s2(on) static source1 to source2 on resistance v gs = 4.5 v, i s1s2 = 8 a 10.5 13.5 16.5 m : v gs = 4.2 v, i s1s2 = 7.4 a 11 14 18 v gs = 3.1 v, i s1s2 = 7 a 11.5 16 21 v gs = 2.5 v, i s1s2 = 6.7 a 12 18 24 v gs = 4.5 v, i s1s2 = 8 a, t j = 125 c 11 20 29 g fs forward transconductance v s1s2 = 5 v, i s1s2 = 8 a 41 s c iss input capacitance v s1s2 = 10 v, v gs = 0 v, f = 1 mhz 1760 2640 pf c oss output capacitance 229 345 pf c rss reverse transfer capacitance 211 320 pf t d(on) turn-on delay time v s1s2 = 10 v, i s1s2 = 8 a, v gs = 4.5 v, r gen = 6 : 12 22 ns t r rise time 19 34 ns t d(off) turn-off delay time 32 51 ns t f fall time 9.5 17 ns q g total gate charge v gs = 0 v to 5 v v s1s2 = 10 v, i s1s2 = 8 a 20 28 nc q g total gate charge v gs = 0 v to 4.5 v 18 25 nc q gs gate to source charge 2.8 nc q gd gate to drain ?miller? charge 5.3 nc i fss maximum continuous source1-source2 diode forward current 8 a v fss source1 to source2 diode forward voltage v g1s 1 = 0 v, v g2s2 = 4.5 v, i fss = 8 a (note 2) 0.8 1.2 v notes: 1. r t ja is determined with the device mounted on a 1 in 2 pad 2 oz copper pad on a 1.5 x 1.5 in. board of fr-4 material. r t jc is guaranteed by design while r t ca is determined by the user's board design. 2. pulse test: pulse width < 300 p s, duty cycle < 2.0%. 3. the diode connected between the gate and source serves only as protection against esd. no gate overvoltage rating is implied . 4. as an n-ch device, the negative vgs rating is for low duty cycle pulse ocurrence only. no continuous rating is implied. a. 57 c/w when mounted on a 1 in 2
FDMB2307NZ dual common dr ain n-channel powertrench ? mosfet www.fairchildsemi.com 3 ?2011 fairchild semiconductor corporation FDMB2307NZ rev.c5 typical characteristics t j = 25c unless otherwise noted figure 1. 0.0 0.2 0.4 0.6 0.8 0 10 20 30 40 v g1s1 = 2.5 v v g1s1 = 4.2 v v g1s1 = 3.1 v pulse duration = 80 s duty cycle = 0.5% max v g2s2 = 4.5 v v g1s1 = 4.5 v i s1s2 , source1 to source2 current (a) v s1s2 , source1 to source2 voltage (v) on-region characteristics figure 2. 0.0 0.2 0.4 0.6 0.8 0 10 20 30 40 v gs = 3.1 v v gs = 2.5 v pulse duration = 80 s duty cycle = 0.5% max v gs = 4.2 v v gs = 4.5 v i s1s2 , source1 to source2 current (a) v s1s2 , source1 to source2 voltage (v) o n - r e g i o n c h a r a c t e r i s t i c s f i g u r e 3 . n o r m a l i z e d o n - r e s i s t a n c e v s drain current and gate voltage 0 10203040 0.5 1.0 1.5 v g1s1 = 4.2 v pulse duration = 80 s duty cycle = 0.5% max v g2s2 = 4.5 v normalized source1 to source2 on-resistance i s1s2 , source1 to source2 current (a) v g1s1 = 2.5 v v g1s1 = 4.5 v v g1s1 = 3.1 v figure 4. 0 10203040 0.5 1.0 1.5 pulse duration = 80 s duty cycle = 0.5% max normalized source1 to source2 on-resistance i s1s2 , source1 to source2 current (a) v gs = 2.5 v v gs = 4.5 v v gs = 3.1 v v gs = 4.2 v n o r m a l i z e d o n - r e s i s t a n c e vs drain current and gate voltage f i g u r e 5 . n o r m a l i z e d o n r e s i s t a n c e -50 -25 0 25 50 75 100 125 150 0.6 0.8 1.0 1.2 1.4 1.6 i s1s2 = 8 a v gs = 4.5 v normalized source1 to source2 on-resistance t j , junction temperature ( o c ) vs junction temperature figure 6. 1.01.52.02.53.03.54.04.5 0 20 40 60 80 t j = 150 o c i s1s2 = 8 a t j = 25 o c v gs , gate to source voltage (v) r s1s2(on) , source1 to source2 on-resistance ( m ) pulse duration = 80 s duty cycle = 0.5% max o n r e s i s t a n c e v s g a t e t o source voltage
FDMB2307NZ dual common dr ain n-channel powertrench ? mosfet www.fairchildsemi.com 4 ?2011 fairchild semiconductor corporation FDMB2307NZ rev.c5 figure 7. 0 . 51 . 01 . 52 . 0 0 10 20 30 40 t j = 150 o c v s1s2 = 5 v pulse duration = 80 s duty cycle = 0.5% max t j = -55 o c t j = 25 o c i s1s2 , source1 to source2 current (a) v gs , gate to source voltage (v) transfer characteristics figure 8. 0.0 0.2 0.4 0.6 0.8 1.0 1.2 0.001 0.01 0.1 1 10 100 t j = 25 o c t j = -55 o c t j = 150 o c v g1s1 = 0 v, v g2s2 = 4.5 v i fss , source1 to source2 forward current (a) v fss , body diode forward voltage (v) s o u r c e 1 t o s o u r c e 2 d i o d e forward voltage vs source current figure 9. gate charge characteristics f i g u r e 1 0 . c a p a c i t a n c e v s s o u r c e 1 t o source2 voltage figure 11. 0481 21 6 10 -10 10 -9 10 -8 10 -7 10 -6 10 -5 10 -4 10 -3 10 -2 10 -1 v s1s2 = 0 v t j = 25 o c t j = 125 o c v gs , gate to source voltage (v) i g , gate leakage current (a) gate leakage current vs gate to source voltage figure 12. 0.01 0.1 1 10 100 0.01 0.1 1 10 100 10 ms 10 s 100 ms dc 1 s 1 ms i s1s2 , source1 to source2 current (a) v s1s2 , source1 to source2 voltage (v) this area is limited by r ds(on) single pulse t j = max rated r ja = 161 o c/w t a = 25 o c f o r w a r d b i a s s a f e operating area typical characteristics t j = 25c unless otherwise noted 0 5 10 15 20 25 0 1 2 3 4 5 v g2s2 = 0 v i s1s2 = 8 a v s1s2 = 12 v v s1s2 = 8 v v g1s1 , gate1 to source1 voltage (v) q g , gate charge (nc) v s1s2 = 10 v 0.1 1 10 20 100 1000 10000 f = 1 mhz v gs = 0 v capacitance (pf) v s1s2 , source1 to source2 voltage (v) c rss c oss c iss
FDMB2307NZ dual common dr ain n-channel powertrench ? mosfet www.fairchildsemi.com 5 ?2011 fairchild semiconductor corporation FDMB2307NZ rev.c5 figure 13. single pulse m aximum power dissipation 10 -3 10 -2 10 -1 11 0 100 1000 0.5 1 10 100 1000 p (pk) , peak transient power (w) single pulse r ja = 161 o c/w t a = 25 o c t, pulse width (sec) figure 14. junction-to-ambient transient thermal response curve typical characteristics t j = 25c unless otherwise noted 10 -3 10 -2 10 -1 11 0 100 1000 0.001 0.01 0.1 1 single pulse r ja = 161 o c/w duty cycle-descending order normalized thermal impedance, z ja t, rectangular pulse duration (sec) d = 0.5 0.2 0.1 0.05 0.02 0.01 2 p dm t 1 t 2 notes: duty factor: d = t 1 /t 2 peak t j = p dm x z ja x r ja + t a
FDMB2307NZ dual common dr ain n-channel powertrench ? mosfet www.fairchildsemi.com 6 ?2011 fairchild semiconductor corporation FDMB2307NZ rev.c5 dimensional outline and pad layout
www.fairchildsemi.com FDMB2307NZ dual common drain n-channel powertrench ? mosfet ?2011 fairchild semiconductor corporation FDMB2307NZ rev.c5 7 trademarks the following includes registered and unregistered trademarks and service marks, owned by fairchild semiconductor and/or its gl obal subsidiaries, and is not intended to be an exhaustive list of all such trademarks. *trademarks of system general corporation, used under license by fairchild semiconductor. disclaimer fairchild semiconductor reserves the right to make changes wi thout further notice to any products herein to improve reliability, function, or design. fairchild does not assume an y liability arising out of the application or use of any product or circuit described herein; neither does it convey an y license under its patent rights, nor the rights of others. these specifications do not expand the term s of fairchild?s worldwide terms and conditions, specifically the warranty therein, which covers these products. life support policy fairchild?s products are not authorized for use as critical co mponents in life support de vices or systems without the express written approval of fai rchild semiconductor corporation. as used here in: 1. life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury of the user. 2. a critical component in any component of a life support, device, or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. product status definitions definition of terms 2cool? accupower? auto-spm? ax-cap?* bitsic ? build it now? coreplus? corepower? crossvolt ? ctl? current transfer logic? deuxpeed ? dual cool? ecospark ? efficentmax? esbc? fairchild ? fairchild semiconductor ? fact quiet series? fact ? fast ? fastvcore? fetbench? flashwriter ? * fps? f-pfs? frfet ? global power resource sm green fps? green fps? e-series? g max ? gto? intellimax? isoplanar? megabuck? microcoupler? microfet? micropak? micropak2? millerdrive? motionmax? motion-spm? mwsaver? optihit? optologic ? optoplanar ? ? pdp spm? power-spm? powertrench ? powerxs? programmable active droop? qfet ? qs? quiet series? rapidconfigure? saving our world, 1mw/w/kw at a time? signalwise? smartmax? smart start? spm ? stealth? superfet ? supersot?-3 supersot?-6 supersot?-8 supremos ? syncfet? sync-lock? ?* the power franchise ? the right technology for your success? ? tinyboost? tinybuck? tinycalc? tinylogic ? tinyopto? tinypower? tinypwm? tinywire? transic ? trifault detect? truecurrent ? * p serdes? uhc ? ultra frfet? unifet? vcx? visualmax? xs? tm ? tm ? tm datasheet identification product status definition advance information formative / in design datasheet contains the design specifications for product development. specifications may change in any manner without notice. preliminary first production datasheet contains preliminary data; supplementary data will be published at a later date. fairchild semiconductor reserves the right to make changes at any time without notice to improve design. no identification needed full production datasheet contains final spec ifications. fairchild semiconductor reserves the right to make changes at any time without notice to improve the design. obsolete not in production datasheet contains specifications on a product that is discontinued by fairchild semiconductor. the datasheet is for reference information only. anti-counterfeiting policy fairchild semiconductor corporation?s anti-counterfeiting policy. fairchild?s anti-counterfeiting policy is also stated on our external website, www.fairchildsemi.com, under sales support . counterfeiting of semiconductor parts is a growing problem in th e industry. all manufactures of semiconductor products are expe riencing counterfeiting of their parts. customers who inadvertently purchase counterfeit parts ex perience many problems such as loss of brand reputation, substa ndard performance, failed application, and increased cost of production and manufacturing de lays. fairchild is taking strong measures to protect ourselve s and our customers from the proliferation of counterfeit parts. fairchild strongly encourages customers to purchase fairchild parts either directly from fa irchild or from authorized fairchild distributors who are listed by country on ou r web page cited above. products customers buy either from fairchild directly or fr om authorized fairchild distributors are genuine parts, have full traceability, meet fairchild?s quality standards for handing and storage and provide access to fairchild?s full range of up-to-date technical and product information. fairchild and our authorized distributors will stand behind all warranties and wi ll appropriately address and warranty issues that may arise. fairchild will not provide any warranty coverage or other assistance for parts bought from unau thorized sources. fairchild is committed to combat this global problem and encourage our customers to do their part in stopping this practice by buying direct or from authorized distributors. rev. i55


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